| 000 | 01124nam a22002297a 4500 | ||
|---|---|---|---|
| 999 |
_c206514 _d206514 |
||
| 005 | 20210324073506.0 | ||
| 022 | _a0305-6120 | ||
| 050 | _ahttps://www.emerald.com/insight/publication/issn/0305-6120/vol/43/iss/2 | ||
| 245 | _aCircuit World | ||
| 260 | _aEmerald | ||
| 310 | _aQuarterly | ||
| 362 | _aVol. 43, No. 2, 2017 | ||
| 520 | _aThe purpose of this study is to show that the humidity levels for surface insulation resistance (SIR)-related failures are dependent on the type of activators used in no-clean flux systems and to demonstrate the possibility of simulating the effects of humidity and contamination on printed circuit board components and sensitive parts if typical SIR data connected to a particular climatic condition are available | ||
| 650 | _2 Corrosion | ||
| 650 | _2 Flux | ||
| 650 | _2 Moisture | ||
| 650 | _2 Ionic contamination | ||
| 650 | _2 Printed circuit boards | ||
| 650 | _2 Circuit simulation | ||
| 856 |
_ahttps://www.emerald.com/insight/publication/issn/0305-6120/vol/43/iss/2 _uhttps://www.emerald.com/insight/publication/issn/0305-6120/vol/43/iss/2 |
||
| 942 | _cE-RESOURCE | ||