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Applications of finite element methods for reliability studies on ULSI interconnections/ Cher Ming Tan ... [et al.]

Contributor(s): Tan, Cher Ming.
Material type: materialTypeLabelBookPublisher: London : Spring, 2011Description: vii, 150 p. : ill.ISBN: 9780857293091.Subject(s): Integrated circuits -- Ultra large Scale | Finite element method | Reliability (Engineering)
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