Applications of finite element methods for reliability studies on ULSI interconnections/  
Cher Ming Tan ... [et al.] 
 - London :   Spring,   2011. 
 - vii, 150 p. :    ill. 
<br/><br/>Includes bibliographical references and index 
<br/><br/><label>ISBN: </label>9780857293091 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Integrated circuits -- Ultra large Scale<br/>Finite element method<br/>Reliability (Engineering)
<br/><br/><label>LC Class. No.: </label>TK 874.76 APP 2011