The GEC Journal of Research.
Material type:
Item type | Current location | Call number | Copy number | Status | Date due | Barcode |
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Main Library Serials | TK1.G4 (Browse shelf) | 1 | Available | 1411997 | |
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Main Library Serials | TK1.G4 (Browse shelf) | 2 | Available | 9187221984 | |
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Main Library Serials | TK1.G4 (Browse shelf) | 3 | Available | 9187321996 |
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It examines theways in which the yield og intergrated circuit production can be improved through the use of circuit design techniques.It also reviews the fault- tolerant techniques which are currently in use and those which have been seriously proposed.It further surveys the crucial topics of yield prediction and of repair technology and outlines the options available for the future.
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