Circuit World
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Item type | Current location | Call number | URL | Status | Date due | Barcode |
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Main Library | https://www.emerald.com/insight/publication/issn/0305-6120/vol/43/iss/2 (Browse shelf) | https://www.emerald.com/insight/publication/issn/0305-6120/vol/43/iss/2 | Available |
The purpose of this study is to show that the humidity levels for surface insulation resistance (SIR)-related failures are dependent on the type of activators used in no-clean flux systems and to demonstrate the possibility of simulating the effects of humidity and contamination on printed circuit board components and sensitive parts if typical SIR data connected to a particular climatic condition are available
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