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The measurement of intelligence : an explanation of and a complete guide for the use of the Stanford revision and extension of the Binet-Simon intelligence scale / with an introd. by Prof. J.J. Findlay.

By: Terman, Lewis Madison, 1877-1956, Terman, Lewis Madison, 1877-1956.
Material type: materialTypeLabelBookPublisher: London : G. Harrap, 1919Subject(s): Mental tests | Stanford-Binet Test
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Bibliography: p. [349]-358.

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