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X-ray analysis papers / a volume of twenty-four selected reprints from Philips Laboratories, Briarcliff Manor, New York, U.S.A.

Contributor(s): Parrish, William, 1914-, Parrish, William, 1914-.
Material type: materialTypeLabelBookPublisher: Eindhoven : Centrex Pub. Co., c1965Edition: [2nd ed.].Subject(s): X-ray crystallography
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Second edition of Advances in X-ray diffractometry and X-ray spectrography.

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